Semiconductor Engineering
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Characterizing Charge Components In TMD-based MOS Structures (imec, KU Leuven, ASM)translating…
Researchers at imec, KU Leuven, and ASM published a technical paper titled “Dissecting the transition metal dichalcogenides-based metal-oxide-semiconductor structures charge components.” Abstract Excerpt: “Different variable charges such as interface traps, oxide border traps…
Keywords#Charge Components#KU Leuven#ASM#Structures#Characterizing